Advanced Synchrotron and XFEL Techniques

Course Description

This course offers insights into advanced techniques using synchrotrons and XFELs, vital tools in research areas like molecular biology, environmental science, and material science. Students will explore various methods including diffraction and scattering, various spectroscopies, and diverse imaging techniques, with a focus on their application in different scientific fields.

What Students Will Learn

  • Elastic scattering and diffraction techniques.
  • Use of X-ray spectroscopies in scientific research.
  • X-ray tomography for material and biological analysis.
  • Lensless imaging techniques and their applications.

Prerequisites

Students are expected to be familiar with first-year undergraduate level mathematical concepts to fully benefit from this advanced course.

What the Course Will Cover

  • Introduction to synchrotron and XFEL technologies.
  • Detailed study and application of diffraction and scattering.
  • In-depth understanding and use of x-ray spectroscopies.
  • Hands-on learning on x-ray tomography.
  • Exploration of lensless imaging techniques.

Who This Course Is For

This course is suited for students, researchers, and professionals in physics, chemistry, biology, and materials science who are interested in the advanced applications of synchrotrons and XFELs for research and development..

Applications in the Real World

Skills learned in this course can be applied in advancing research in pharmaceuticals, materials science, archaeology, and environmental science through enhanced imaging and analytical techniques. These skills are valuable for conducting more in-depth studies with greater accuracy in both academia and industry.

Syllabus

  • Week 1: Introduction to diffraction and scattering, including its basics and theory.
  • Week 2: Various diffraction techniques, including single-crystal and powder diffraction.
  • Week 3: Theory and practical aspects of x-ray spectroscopy and absorption spectroscopy.
  • Week 4: Understanding of x-ray emission and electron spectroscopies.
  • Week 5: X-ray tomography techniques and other full-field x-ray microscopies.
  • Week 6: Advanced lensless imaging and x-ray photon correlation spectroscopy.